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Comptes Rendus Physique



Vol 15 - N°2-3 - February 2014
Seeing and measuring with electrons: Transmission Electron Microscopy today and tomorrow
P. 101-296
© 2019, Elsevier Masson SAS



page IFC

page iii

Electron microscopy / Microscopie électronique
pages 101-109
Christian Colliex
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Electron microscopy / Microscopie électronique
pages 110-118
Peter Hawkes
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Electron microscopy / Microscopie électronique
pages 119-125
Christoph T. Koch, Wouter Van den Broek
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Electron microscopy / Microscopie électronique
pages 126-139
Giulio Pozzi, Marco Beleggia, Takeshi Kasama, Rafal E. Dunin-Borkowski
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Electron microscopy / Microscopie électronique
pages 140-150
Sara Bals, Bart Goris, Thomas Altantzis, Hamed Heidari, Sandra Van Aert, Gustaaf Van Tendeloo
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Electron microscopy / Microscopie électronique
pages 151-157
Kazu Suenaga
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Electron microscopy / Microscopie électronique
pages 158-175
Mathieu Kociak, Odile Stéphan, Alexandre Gloter, Luiz F. Zagonel, Luiz H.G. Tizei, Marcel Tencé, Katia March, Jean Denis Blazit, Zackaria Mahfoud, Arthur Losquin, Sophie Meuret, Christian Colliex
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Electron microscopy / Microscopie électronique
pages 176-189
J. Spencer Baskin, Ahmed H. Zewail
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Electron microscopy / Microscopie électronique
pages 190-199
Jo Verbeeck, Giulio Guzzinati, Laura Clark, Roeland Juchtmans, Ruben Van Boxem, He Tian, Armand Béché, Axel Lubk, Gustaaf Van Tendeloo
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Electron microscopy / Microscopie électronique
pages 200-213
Edward D. Boyes, Pratibha L. Gai
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Electron microscopy / Microscopie électronique
pages 214-223
Tobias Schuh, Niels de Jonge
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Electron microscopy / Microscopie électronique
pages 224-240
Marc Legros
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Electron microscopy / Microscopie électronique
pages 241-257
Clemens Mangler, Jannik C. Meyer
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Electron microscopy / Microscopie électronique
pages 258-268
Bingsen Zhang, Dang Sheng Su
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Electron microscopy / Microscopie électronique
pages 269-275
Simon P. Ringer, Miles H. Apperley
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Electron microscopy / Microscopie électronique
pages 276-280
Thierry Épicier, Étienne Snoeck
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Electron microscopy / Microscopie électronique
pages 281-284
Etienne Snoeck, Gustaaf Van Tendeloo
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page IBC

Original Article
pages 285-296
Christopher Herzog, Maxim Olshanii, Yvan Castin
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