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Comptes Rendus Physique
Volume 15, n° 2-3
pages 176-189 (février 2014)
Doi : 10.1016/j.crhy.2013.11.002
Seeing in 4D with electrons: Development of ultrafast electron microscopy at Caltech
Voir en 4D avec des électrons : développement de la microscopie électronique ultra-rapide au Caltech

J. Spencer Baskin, Ahmed H. Zewail
 Physical Biology Center for Ultrafast Science and Technology, Arthur Amos Noyes Laboratory of Chemical Physics, California Institute of Technology, Pasadena, CA 91125, United States of America 

Corresponding author.

The vision to develop 4D electron microscopy, a union of the capabilities of electron microscopy with ultrafast techniques to capture clearly defined images of the nanoscale structure of a material at each step in the course of its chemical or physical transformations, has been pursued at Caltech for the last decade. In this contribution, we will give a brief overview of the capabilities of three currently active Caltech 4D microscopy laboratories. Ongoing work is illustrated by a description of the most recent application of photon-induced near-field electron microscopy (PINEM), a field made possible only by the development of the 4D ultrafast electron microscopy (UEM). An appendix gives the various applications made so far and the historic roots of the development at Caltech.

The full text of this article is available in PDF format.

Tout au long de ces dix dernières années, le Caltech a consacré un effort permanent au développement d'un projet visionnaire, à savoir la microscopie électronique à 4D, une union des possibilités de la microscopie électronique avec les techniques des temps ultra-courts afin de capturer des images claires de la structure nanométrique des matériaux au cours des différentes étapes de leur transformation. Dans cette contribution, nous présentons une brève revue des possibilités techniques des trois plates-formes de microscopie électronique 4D actuellement opérationnelles au Caltech. Parmi les travaux en cours, nous décrirons plus spécialement les résultats les plus récents obtenus en microscopie électronique photo-induite de champ proche (PINEM), un domaine rendu accessible uniquement par les progrès en microscopie électronique ultra-rapide. Nous terminerons par une revue des diverses applications réalisées à ce jour au Caltech dans le prolongement de leurs sources historiques.

The full text of this article is available in PDF format.

Keywords : Near-field, PINEM, Atomic steps, Electron microscopy

Mots-clés : Champ proche, PINEM, Marches atomiques, Microscopie électronique

1  In the following list, publications are labeled to indicate diffraction (D), crystallography (C), and microscopy (M).

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